IEC/EN 61032 IEC60529 test probe kits for ip1x ip2x ip3x ip4x accessibility probes

IEC/EN 61032 60529 test probe kits for ip1x ip2x ip3x ip4x accessibility probes

The HNT-PKIT test probe kits is designed to provide the probes required by UL / IEC / EN 61032, the IP Code standard. It includes the following products: 

· Test Sphere Probe with handle (HNT-PA)

· Jointed Finger Probe (with banana jack in handle) (HNT-PB)

· 2.5 mm Test Rod (HNT-PC)

· 1.0 mm Test Wire (HNT-PD)

· aluminum suitcase

Meets Requirements for Testing Standard(s) including but not limited to:IEC61032

IP1X Probe A Technical Parameters:

1, Ball Diameter: 50mm

2, Baffle Plate Diameter: 45mm

3, Baffle Plate Thickness:4mm

4, Handle Diameter: 10mm

5, Handle Length :100mm

IP2X Test Finger Probe Technical Parameters:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

IP3X Test Probe C technical parameters

1,  Test Probe Length :100mm

2,  Test Probe Diameter:2.5mm

3,  Dam- sphere Diameter:35mm

4,  Handle Diameter:10mm

5,  Handle Length 100mm

IP4X Test Probe D Technical parameters

1, Test Probe Length :100mm

2, Test Probe Diameter:1.0mm

3,Dam- sphere Diameter:35mm

4,Handle Diameter:10mm

5,Handle Length 100mm